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Poster Fri, Dec 5, 2025 • 4:30 PM – 7:30 PM PST Exhibit Hall C,D,E #414

A Closed-Form Solution for Fast and Reliable Adaptive Testing

Yan Zhuang · Chenye Ke · Zirui Liu · Qi Liu · Yuting Ning · Zhenya Huang · Weizhe Huang · Qingyang Mao · Shijin Wang

Abstract

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