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Poster Fri, Dec 11, 2026 • 2:00 AM – 5:00 AM AEDT Hall C1

(Strongly) Replicable Distribution Testers imply High Probability Distribution Testers

Ilias Diakonikolas ⋅ Jingyi Gao ⋅ Daniel Kane ⋅ Sihan Liu ⋅ Christopher Ye

Abstract

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